Date:2011-05-27 00:42:57 (8 years 6 months ago)
Author:Werner Almesberger
Commit:f5c46de802c330a75434e33d428aa7e4233f7be4
Message:prod/doc/test.html: added a decription of the tests

Files: prod/doc/Makefile (2 diffs)
prod/doc/test.html (3 diffs)

Change Details

prod/doc/Makefile
11PNGS=flow.png setup-A.png setup-B.png setup-C.png setup-D.png
22HTMLS=index.html setup.html flash.html test.html analysis.html
3JPGS=atusb-programming.jpg
3JPGS=atusb-programming.jpg atrf-path.png atrf-path-small.png
44
55.PHONY: all upload clean
66
...... 
1717atusb-programming.jpg:
1818        wget http://downloads.qi-hardware.com/people/werner/wpan/tmp/atusb-programming.jpg
1919
20atrf-path.png:
21        wget http://downloads.qi-hardware.com/people/werner/wpan/tmp/atrf-path.png
22
23atrf-path-small.png: \
24          atrf-path.png
25        convert -scale 50% $< $@
26
2027upload: $(HTMLS) $(PNGS) $(JPGS)
2128        rsync -e ssh $^ \
2229            www-data@downloads.qi-hardware.com:werner/wpan/prod/
prod/doc/test.html
55
66
77<!-- ====================================================================== -->
8<!-- ---------------------------------------------------------------------- -->
98
109
1110<H2>Test setup for atben</H2>
1211
12To test an <B>atben</B> board, place a reference <B>atusb</B> board into
13the PC, insert the
1314<P>
1415<IMG src="setup-A.png">
1516<P>
...... 
3031
3132<H2>Test procedure</H2>
3233
34The test process is started with
35<PRE>
36make ben
37</PRE>
38for an <B>atben</B> DUT and with
39<PRE>
40make usb
41</PRE>
42for an <B>atusb</B> DUT. It performs the following steps:
43<UL>
44  <LI>Enumeration (<B>atusb</B> only)
45  <LI>LED (<B>atusb</B> only; not yet implemented)
46  <LI>GPIO scan (not yet implemented)
47  <LI>Identification
48  <LI>Crystal frequency (only implemented on <B>atben</B>)
49  <LI>Spectrum
50  <LI>Receive
51  <LI>Send
52</UL>
53
54Of these tests, only "LED" and "Spectrum" require operator input. The
55other tests run without interaction.
56<P>
57The test scripts log the commands they execute and their output in the
58file <B>_log</B>.
59
60
61<!-- ---------------------------------------------------------------------- -->
62
63
64<H3>Enumeration (atusb only)</H3>
65
66The enumeration test verifies that the <B>atusb</B> board has been
67identified by the PC's USB stack. If this test fails, the board may
68not be plugged in correctly or it may be missing the firmware. A
69board that has passed both stages of the firmware flashing process
70should always pass the enumeration test.
71
72
73<!-- ---------------------------------------------------------------------- -->
74
75
76<H3>LED (atusb only)</H3>
77
78@@@
79
80
81<!-- ---------------------------------------------------------------------- -->
82
83
84<H3>GPIO scan</H3>
85
86@@@
87
88
89<!-- ---------------------------------------------------------------------- -->
90
91
92<H3>Identification</H3>
93
94This test reads the transceiver's registers that contain values identifying
95the manufacturer, the chip's part number, and the chip revision. If an
96<B>atusb</B> board fails this test, this probably means that the MISO signal
97between transceiver and the microcontroller has a problem.
98<P>
99On <B>atben</B>, failure may simply indicate an improperly
100inserted board. Eject the board, re-insert, and try again. If the test
101keeps on failing, this may indicate a problem with MOSI, MISO, nSEL,
102SCLK, the power supply, the crystal oscillator, or possibly the position
103of the transceiver chip.
104<P>
105Note: this test is meant as a higher level test. The GPIO test should
106eventually provide more detailed results for problems with the SPI interface.
107
108
109<!-- ---------------------------------------------------------------------- -->
110
111
112<H3>Crystal frequency (atben only)</H3>
113
114This test measures the frequency of the crystal oscillator in the DUT.
115On <B>atben</B>, it does this by transmitting packets, and measuring
116the time between the SLP_TR pulse that starts the transmission and the
117interrupt signaling the end of the transmission.
118<P>
119If this test fails, this may indicate that the load capacitors of the
120crystal are missing, badly soldered, or have the wrong value. It could
121also mean that the crystal itself is defective. Another possible cause
122of oscillator malfunction could be flux residues bridging traces.
123<P>
124The <A href="fault.html">fault analysis page</A> has more details on
125testing the crystal oscillator.
126
127
128<!-- ---------------------------------------------------------------------- -->
129
130
131<H3>Spectrum</H3>
132
133The spectrum test measures the reception of a signal sent from the
134reference device to the DUT. It does this across the entire frequency
135range in which the WPAN boards operate, allowing the detection of
136frequency-dependent anomalies.
137<P>
138This test depends on numerous external factors, like the exact position
139and orientation of the two devices with respect to each other, and the
140presence of any items that can reflect or absorb RF signals. Such items
141include metal chairs and human bodies. Because of the test's sensitivity
142to environmental factors, the operator needs to decide when the result
143represents a valid measurement and then confirm the result shown.
144<P>
145The image below shows the typical display during the spectrum test:
146the white line is the measured signal strength. The red lines indicate
147the minimum and maximum allowed values. The green circle in the upper
148right corner indicates that the signal strength is within the limits.
149A downward-pointing red triangle would indicate that the signal is too
150weak, an upward-pointing yellow triangle would indicate that the signal
151is too strong.
152<P>
153<A href="atrf-path.png"><IMG src="atrf-path-small.png"</A>
154<P>
155To finish the test, the operator must type either <B>P</B>, <B>F</B>,
156or <B>Q</B> in the window shown. <B>P</B> means "pass" and can only be
157entered if the measurement is within the limits. <B>F</B> means "fail"
158and can only be entered if the measurements is outside the limits.
159<B>Q</B>, quit, can be entered at any time and also fails the test.
160
161
162<!-- ---------------------------------------------------------------------- -->
163
164
165<H3>Receive</H3>
166
167In the receive test, the reference device sends a number of frames to the
168DUT. The test program verifies correct reception of all the frames. A
169device that has passed all the preceding tests should not encounter
170problems in the receive test. If it does, there may be a problem with
171the bypassing of the transceiver's 1.8 V supplies.
172
173
174<!-- ---------------------------------------------------------------------- -->
175
176
177<H3>Send</H3>
178
179The send test is like the receive test, but with the DUT acting as the
180sender and the reference acting as the receiver. If a device passes the
181receive test but fails the send test, there is probably an issue with
182the bypass capacitors of the analog 1.8 V supply.
183<P>
184Another possible cause could a problem with the SLP_TR signal. The
185GPIO test should eventually catch this issue, but it may currently
186remain undetected until the send test.
33187
34188<P>
35189<HR>
...... 
37191Prev: <A href="flash.html">Flashing (<B>atusb</B> only)</A>&nbsp;
38192Next: <A href="analysis.html">Fault analysis</A>&nbsp;
39193<HR>
40Last update: 2011-05-18&nbsp;&nbsp;<I>Werner Almesberger</I>
194Last update: 2011-05-26&nbsp;&nbsp;<I>Werner Almesberger</I>
41195<HR>
42196</BODY>
43197</HTML>

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